True Random Number Generation of Very High Goodness-of-fit and Randomness Qualities

dc.contributor.authorTanyer, Suleyman Gokhun
dc.contributor.researcherIDI-5023-2013en_US
dc.date.accessioned2024-03-20T11:45:25Z
dc.date.available2024-03-20T11:45:25Z
dc.date.issued2014
dc.description.abstractThe statistical nature of numerous problems in mathematics, physics and engineering have led to the development of methods for generating random data for a given distribution. Ancient methods include; dice, coin flipping and shuffling of cards. Today, various pseudo, quasi and true random generators ( RNGs) are being proposed for their improved properties. In this work, test metrics for goodness-of-fit and randomness are reviewed. The method of uniform sampling ( MUS) is modified for improving the randomness without harming the goodness-of-fit qualities. The test results illustrate that very high goodness-of-fit can be obtained even when the number of observed samples is as small as 10.en_US
dc.identifier.endpage215en_US
dc.identifier.scopus2-s2.0-84949927853en_US
dc.identifier.startpage213en_US
dc.identifier.urihttp://hdl.handle.net/11727/11901
dc.identifier.wos000380446200035en_US
dc.language.isoengen_US
dc.relation.isversionofDOI10.1109/MCSI.2014.47en_US
dc.relation.journal2014 INTERNATIONAL CONFERENCE ON MATHEMATICS AND COMPUTERS IN SCIENCES AND IN INDUSTRY (MCSI 2014)en_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectrandom number generatoren_US
dc.subjectstatistical signal processingen_US
dc.subjectprobabilityen_US
dc.subjecttest statisticsen_US
dc.titleTrue Random Number Generation of Very High Goodness-of-fit and Randomness Qualitiesen_US
dc.typeconferenceObjecten_US

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